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Title: Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies, Author: António Manuel Lourenço Canelas
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Title: Yield And Reliability In Microwave Circuit And System Design, Author: Michael D Meehan
Title: X-Rays and Extreme Ultraviolet Radiation: Principles and Applications / Edition 2, Author: David Attwood
Title: X-ray Scattering From Semiconductors And Other Materials (3rd Edition) / Edition 3, Author: Paul F Fewster
Title: X-ray Scattering From Semiconductors (2nd Edition) / Edition 2, Author: Paul F Fewster
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Title: Wireless Technologies: Circuits, Systems, and Devices / Edition 1, Author: Krzysztof Iniewski
Title: Wireless Sensor Systems for Extreme Environments: Space, Underwater, Underground, and Industrial / Edition 1, Author: Habib F. Rashvand

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