X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures / Edition 1

by Martin Schmidbauer

Overview

This monograph represents a critical survey of the outstanding capabilities of X-ray

diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

Product Details

ISBN-13:	9783642057694
Publisher:	Springer Berlin Heidelberg
Publication date:	12/09/2010
Series:	Springer Tracts in Modern Physics , #199
Edition description:	Softcover reprint of hardcover 1st ed. 2004
Pages:	204
Product dimensions:	6.10(w) x 9.25(h) x 0.24(d)

Table of Contents

A Brief Introduction to the Topic.- Basic Principles of X-Ray Diffuse Scattering on Mesoscopic Structures.- Experimental Optimization.- A Model System: LPE SiGe/Si(001) Islands.- Dynamical Scattering at Grazing Incidence.- Characterization of Quantum Dots.- Characterization of Interface Roughness.- Appendix.