X-Ray Optics: High-Energy-Resolution Applications / Edition 1

by Yuri Shvyd'ko

Overview

The use of x rays has moved in the forefront of science and technology in the second half of the 20th century. This progress has been greatly stimulated by the advent of synchrotron x-ray sources in the 1960s. The undulator-based synchrotron radiation sources which have appeared in the last decade of the 20th century gave a new impetus to such development. The brilliance of the x-ray sources has increased by 12 orders of magnitude in 40 years and this trend does not show any signs of stagnation. The future x-ray sources of the 21th century based on free-electron lasers driven by linear accelerators will provide sub-picosecond radiation pulses with by many orders of magnitude higher brilliance and full transverse coherence. The x-ray sources of the newest generation offer a possibility to realize more than ever before the great potential of x-ray optics and, as a consequence, to elaborate new sophisticated instrumentation with unprecedented resolution and eventually to move in new directions of research in x-ray technology, materials science, fundamental physics, life sciences, etc.

Product Details

ISBN-13:	9783540214847
Publisher:	Springer Berlin Heidelberg
Publication date:	08/05/2004
Series:	Springer Series in Optical Sciences , #98
Edition description:	2004
Pages:	406
Product dimensions:	6.10(w) x 9.25(h) x 0.04(d)

Table of Contents

1. Overview of the Field.- 2. Dynamical Theory of X-Ray Diffraction (Focus on Backscattering).- 3. Principles of Multiple-Crystal X-Ray Diffraction.- 4. Theory of X-Ray Fabry-Pérot Resonators.- 5. High-Resolution X-Ray Monochromators.- 6. High-Resolution X-Ray Analyzers.- 7. Towards Realizing X-Ray Resonators.- A. Appendices.- A.1 Si Crystal Data.- A.3 Bragg Back-Reflections in Si.- A.5 Low-Lying Levels of Stable Isotopes.- A.8 Radiation Wavelength and Angle of Incidence for Exact Bragg Backscattering.- List of Symbols.