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9780792381075
Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development / Edition 1 available in Hardcover
![Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development / Edition 1](http://img.images-bn.com/static/redesign/srcs/images/grey-box.png?v11.12.6)
Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development / Edition 1
- ISBN-10:
- 0792381076
- ISBN-13:
- 9780792381075
- Pub. Date:
- 01/31/1998
- Publisher:
- Springer US
- ISBN-10:
- 0792381076
- ISBN-13:
- 9780792381075
- Pub. Date:
- 01/31/1998
- Publisher:
- Springer US
169.99
In Stock
Product Details
ISBN-13: | 9780792381075 |
---|---|
Publisher: | Springer US |
Publication date: | 01/31/1998 |
Edition description: | 1998 |
Pages: | 394 |
Product dimensions: | 6.10(w) x 9.25(h) x 0.24(d) |
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