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9783030067472
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact available in Hardcover, Paperback, eBook
![Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact](http://img.images-bn.com/static/redesign/srcs/images/grey-box.png?v11.11.4)
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact
- ISBN-10:
- 3030067475
- ISBN-13:
- 9783030067472
- Pub. Date:
- 01/30/2019
- Publisher:
- Springer International Publishing
- ISBN-10:
- 3030067475
- ISBN-13:
- 9783030067472
- Pub. Date:
- 01/30/2019
- Publisher:
- Springer International Publishing
![Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact](http://img.images-bn.com/static/redesign/srcs/images/grey-box.png?v11.11.4)
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact
$199.99
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Product Details
ISBN-13: | 9783030067472 |
---|---|
Publisher: | Springer International Publishing |
Publication date: | 01/30/2019 |
Series: | Springer Series in Materials Science , #270 |
Edition description: | Softcover reprint of the original 1st ed. 2018 |
Pages: | 438 |
Product dimensions: | 6.10(w) x 9.25(h) x (d) |
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