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9783540434436
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination / Edition 1 available in Hardcover
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination / Edition 1
- ISBN-10:
- 3540434437
- ISBN-13:
- 9783540434436
- Pub. Date:
- 10/03/2002
- Publisher:
- Springer Berlin Heidelberg
- ISBN-10:
- 3540434437
- ISBN-13:
- 9783540434436
- Pub. Date:
- 10/03/2002
- Publisher:
- Springer Berlin Heidelberg
219.99
In Stock
Product Details
ISBN-13: | 9783540434436 |
---|---|
Publisher: | Springer Berlin Heidelberg |
Publication date: | 10/03/2002 |
Series: | Springer Tracts in Modern Physics , #179 |
Edition description: | 2002 |
Pages: | 214 |
Product dimensions: | 6.10(w) x 9.25(h) x 0.02(d) |
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