Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope

Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope

by Peter W. Hawkes
ISBN-10:
0123749867
ISBN-13:
9780123749864
Pub. Date:
11/17/2009
Publisher:
Elsevier Science
ISBN-10:
0123749867
ISBN-13:
9780123749864
Pub. Date:
11/17/2009
Publisher:
Elsevier Science
Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope

Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope

by Peter W. Hawkes
$260.0
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Overview

Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.

Product Details

ISBN-13: 9780123749864
Publisher: Elsevier Science
Publication date: 11/17/2009
Series: Advances in Imaging and Electron Physics , #159
Pages: 320
Product dimensions: 6.20(w) x 9.00(h) x 1.20(d)

About the Author

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Table of Contents

The beginnings and development of the scanning transmission electron microscope (STEM)
Albert V. Crewe
STEM in the life sciences
Andreas Engel
The AEI and Siemens STEM instruments
Peter Hawkes
STEM in Japan
Hiromi Inada
Early work on the STEM
Michael S. Isaacson
The Toulouse high-voltage STEM project
Bernard Jouffrey
Aberration-corrected STEM
Ondrej Krivanek
STEM in Cambridge
K.C.A. Smith
A review of the cold field electron cathode
Lyn Swanson and Greg Schwind
STEM in Oxford and at Vacuum Generators
Sebastian von Harrach
The Vacuum Generators STEM
Ian Wardell and Peter Bovey
Historical background of the STEM at Brookhaven National Laboratory
Joseph Wall
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