Title: Correct Hardware Design and Verification Methods: IFIP WG10.5 Advanced Research Working Conference, CHARME '95, Frankfurt, Germany, October 1995. Proceedings / Edition 1, Author: Paolo Enrico Camurati
Title: Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics / Edition 1, Author: Robert K. Brayton
Title: Current-Mode VLSI Analog Filters: Design and Applications / Edition 1, Author: P.V. Ananda Mohan
Title: Delay Fault Testing for VLSI Circuits / Edition 1, Author: Angela Krstic
Title: Design of Integrated Circuits for Optical Communications / Edition 2, Author: Behzad Razavi
Title: Design Systems for VLSI Circuits: Logic Synthesis and Silicon Compilation / Edition 1, Author: Giovanni DeMicheli
Title: Digital Circuit Boards: Mach 1 GHz / Edition 1, Author: Ralph Morrison
Title: Digital Logic Testing and Simulation / Edition 2, Author: Alexander Miczo
Title: Digital Timing Macromodeling for VLSI Design Verification / Edition 1, Author: Jeong-Taek Kong
Title: Dimension Reduction of Large-Scale Systems: Proceedings of a Workshop held in Oberwolfach, Germany, October 19-25, 2003 / Edition 1, Author: Peter Benner
Title: Dry Etching for VLSI / Edition 1, Author: A.J. van Roosmalen
Title: Electrical Modeling and Design for 3D System Integration: 3D Integrated Circuits and Packaging, Signal Integrity, Power Integrity and EMC / Edition 1, Author: Er-Ping Li
Title: Electrothermal Analysis of VLSI Systems / Edition 1, Author: Yi-Kan Cheng
Title: Engineering the CMOS Library: Enhancing Digital Design Kits for Competitive Silicon / Edition 1, Author: David Doman
Title: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits / Edition 1, Author: M. Bushnell
Title: Evolutionary Algorithms for VLSI CAD / Edition 1, Author: Rolf Drechsler
Title: Fault Covering Problems in Reconfigurable VLSI Systems / Edition 1, Author: Ran Libeskind-Hadas
Title: Feedback-Based Orthogonal Digital Filters: Theory, Applications, and Implementation / Edition 1, Author: Mukund Padmanabhan
Title: Formal Hardware Verification: Methods and Systems in Comparison / Edition 1, Author: Thomas Kropf
Title: From Contamination to Defects, Faults and Yield Loss: Simulation and Applications / Edition 1, Author: Jitendra B. Khare

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