Windowed Fringe Pattern Analysis

by Qian Kemao

Overview

This book provides solutions to the challenges involved in fringe pattern analysis, covering techniques for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. Both theoretical analysis and algorithm development are covered to facilitate the work of researchers and engineers. The information presented is also appropriate as a specialized subject for students of optical and computer engineering.

Product Details

ISBN-13:	9780819496423
Publisher:	SPIE Press
Publication date:	08/12/2013
Sold by:	Barnes & Noble
Format:	eBook
File size:	22 MB
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