VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

by S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh

Overview

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

Product Details

ISBN-13:	9789811359491
Publisher:	Springer Nature Singapore
Publication date:	01/25/2019
Series:	Communications in Computer and Information Science , #892
Edition description:	1st ed. 2019
Pages:	722
Product dimensions:	6.10(w) x 9.25(h) x (d)

Table of Contents

Digital design.- Analog and mixed signal design.- Hardware security.- Micro bio-fluidics.- VLSI testing.- Analog circuits and devices.- Network-on-chip.- Memory.- Quantum computing and NoC.- Sensors and interfaces.