The Boundary-Scan Handbook
Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book.

Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers;

Explains the new IEEE 1149.8.1 subsidiary standard and applications;

Describes the latest updates on the supplementary IEEE testing standards.

In particular, addresses:

IEEE Std 1149.1         Digital Boundary-Scan
IEEE Std 1149.4         Analog Boundary-Scan
IEEE Std 1149.6         Advanced I/O Testing
IEEE Std 1149.8.1        Passive Component Testing
IEEE Std 1149.1-2013       The 2013 Revision of 1149.1
IEEE Std 1532          In-System Configuration
IEEE Std 1149.6-2015       The 2015 Revision of 1149.6

1116786269
The Boundary-Scan Handbook
Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book.

Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers;

Explains the new IEEE 1149.8.1 subsidiary standard and applications;

Describes the latest updates on the supplementary IEEE testing standards.

In particular, addresses:

IEEE Std 1149.1         Digital Boundary-Scan
IEEE Std 1149.4         Analog Boundary-Scan
IEEE Std 1149.6         Advanced I/O Testing
IEEE Std 1149.8.1        Passive Component Testing
IEEE Std 1149.1-2013       The 2013 Revision of 1149.1
IEEE Std 1532          In-System Configuration
IEEE Std 1149.6-2015       The 2015 Revision of 1149.6

199.99 In Stock
The Boundary-Scan Handbook

The Boundary-Scan Handbook

by Kenneth P. Parker
The Boundary-Scan Handbook

The Boundary-Scan Handbook

by Kenneth P. Parker

Hardcover(4th ed. 2016)

$199.99 
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Overview

Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book.

Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers;

Explains the new IEEE 1149.8.1 subsidiary standard and applications;

Describes the latest updates on the supplementary IEEE testing standards.

In particular, addresses:

IEEE Std 1149.1         Digital Boundary-Scan
IEEE Std 1149.4         Analog Boundary-Scan
IEEE Std 1149.6         Advanced I/O Testing
IEEE Std 1149.8.1        Passive Component Testing
IEEE Std 1149.1-2013       The 2013 Revision of 1149.1
IEEE Std 1532          In-System Configuration
IEEE Std 1149.6-2015       The 2015 Revision of 1149.6


Product Details

ISBN-13: 9783319011738
Publisher: Springer International Publishing
Publication date: 11/12/2015
Edition description: 4th ed. 2016
Pages: 552
Product dimensions: 6.10(w) x 9.25(h) x (d)

About the Author

Dr. Kenneth P. Parker received his PHD at Stanford University. He has recently retired from a career with Hewlett-Packard and Agilent Technologies in the field of testing of electrical assemblies.

Table of Contents

Boundary-Scan Basics And Vocabulary.- Boundary-Scan Description Language (BSDL).- Boundary-Scan Testing.- Advanced Boundary-Scan Topics.- Design for Boundary-Scan Test.- Analog Measurement Basics.- IEEE 1149.4 Analog Boundary-Scan.- IEEE 1149.6 Testing Advanced I/O.- IEEE 1532:In-System Configuration.- IEEE 1149.8.1: Passive Components.- IEEE 1149.1:The 2013 Revision.- IEEE 1149.6: The 2015 Revision.
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