Subsurface Contamination Monitoring Using Laser Fluorescence

Subsurface Contamination Monitoring Using Laser Fluorescence

Subsurface Contamination Monitoring Using Laser Fluorescence

Subsurface Contamination Monitoring Using Laser Fluorescence

eBook

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Overview

While innovative technologies in remediation need to be developed, so do innovative ways of site assessment. This monograph describes the development, testing, and performance of a new laser-induced fluorescence soil probe. A screening tool for site characterization, this probe has the potential to provide an economical, rapid assessment of contaminated sites.
Cone Penetrometer testing equipment advances the probe into the subsurface. The probe identifies hydrocarbon classes using a multi-channel excitation-emission matrix. This technique facilitates the collection of significant amounts of subsurface information - surpassing conventional data collection methods - that can be used to rapidly identify areas of concern beneath a site. The technology has significant application for the following:

  • Rapid environmental site assessment
  • Monitoring remediation programs
  • Monitoring manufacturing processes and industrial waste water operations
    Subsurface Contamination Monitoring Using Laser Fluorescence provides comprehensive reference material for researchers and engineers as well as engineering consultants interested in subsurface monitoring techniques or further development of this technology. It describes innovative technology that focuses on finding cost effective solutions for site assessment and remediation.

  • Product Details

    ISBN-13: 9781000724462
    Publisher: CRC Press
    Publication date: 08/16/2019
    Series: AATDF Monograph Series
    Sold by: Barnes & Noble
    Format: eBook
    Pages: 184
    File size: 5 MB

    About the Author

    Katherine Balshaw-Biddle, Carroll L. Oubre, C.H.Ward

    Table of Contents

    Introduction. LIF-EEM Engineering Design. Summary of Technology Demonstration. Data Interpretation and Evaluation. Outlook. Applicability of the LIF-EEM Technology. Comparison with Other LIF Systems.
    REFERENCES
    APPENDICES

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