STRAIN AND DISLOCATION GRADIENTS FROM DIFFRACTION: Spatially-Resolved Local Structure and Defects

by Rozaliya I Barabash (Editor), Gene Ice (Editor)

Overview

This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.

Product Details

ISBN-13:	9781908979643
Publisher:	Imperial College Press
Publication date:	04/07/2014
Sold by:	Barnes & Noble
Format:	eBook
Pages:	480
File size:	10 MB

Table of Contents

Preface Rozaliya I. Barubash Gene E. Ice v

Editor Biographies ix

Chapter 1 Diffraction Analysis of Defects: State of the Art Rozaliya I. Barabash Gene E. Ice 1

Chapter 2 X-ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source Wenjun Liu Gene E. Ice 53

Chapter 3 High-Energy Transmission Laue (HETL) Micro-Beam Diffraction Felix Hofmann Alexander M. Korsunsky 82

Chapter 4 XMAS: A Versatile Tool for Analyzing Synchrotron X-ray Microdiffraction Data Nobumichi Tamura 125

Chapter 5 Laue Microdiffraction at the ESRF Odile Robach Christoph Kirchlechner Jean-Sébastien Micha Olivier Ulrich Xavier Biquard Olivier Geaymond Olivier Castelnau Michel Bornert Johann Petit Sophie Berveiller Olivier Sicardy Julie Villanova François Rieutord 156

Chapter 6 3D X-Ray Diffraction Microscopy Henning Friis Poulsen Søren Schmidt Dorte Juul Jensen Henning Osholm Sørensen Erik Mejdal Lauridsen Ulrik Lund Olsen Wolfgang Ludwig Andrew King Jonathan Paul Wright Gavin B.M. Vaughan 205

Chapter 7 Grain Centre Mapping - 3DXRD Measurements of Average Grain Characteristic Jette Oddershede Søren Schmidt Allan Lyckegaard Erik Mejdal Lauridsen Jonathan Paul Wright Grethe Winther 254

Chapter 8 Three-Dimensional X-ray Diffraction (3DXRD) Imaging Techniques Wolfgang Ludwig Andrew King Péter Reischig 280

Chapter 9 High-Resolution Reciprocal Space Mapping for Characterizing Deformation Structures Wolfgang Pantleon Christian Wejdemann Bo Jakobsen Henning Friis Poulsen Ulrich Lienert 322

Chapter 10 Reconstructing 2D and 3D X-ray Orientation Maps from White-Beam Laue Jonathan Z. Tischler 358

Chapter 11 Energy-Variable X-ray Diffraction for Studying Polycrystalline Materials with High Depth Resolution Emil Zolotoyabko 376

Chapter 12 Micrestructure Detail Extraction via EBSD: An Overview David Fullwood Brent Adams Jay Basinger Timothy Ruggles Ali Khosravani Caroline Sorensen Joshua Kacher 405

Chapter 13 High-Pressure Studies with Microdiffraction Wenge Yang 438

Author Index 451

Subject Index 455