Reliability And Degradation Of Iii-V Optical Devices / Edition 1

by Osamu Ueda

Overview

In developing III-V optical devices for use in optical fiber communication systems, digital-audio systems, and optical printers, reliability is paramount. Understanding the origins and causes of degradation is critical to successful design. This unique book focuses specifically on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing better understand the mechanism of degradation and details the major degradation modes of optical devices fabricated from three different systems. The book explains the character of defects and imperfections induced during material growth and fabrication, presents techniques for failure analysis, and describes methods for elimination of defect-generating mechanisms. More than 200 illustrations and 40 equations help clarify important concepts.

Product Details

ISBN-13:	9780890066522
Publisher:	Artech House, Incorporated
Publication date:	09/30/1996
Series:	Optoelectronics Library Series
Edition description:	New Edition
Pages:	372
Product dimensions:	6.14(w) x 9.21(h) x 0.88(d)

About the Author

Osamu Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. He earned his Ph.D. in physical engineering from the University of Tokyo. Dr. Ueda has written more than 100 professional papers and is a member of the Society of Applied Physics, the Society of Electron Microscopy, the Electrochemical Society, and the Materials Research Society.

Table of Contents

Contents:
Introduction.

Materials and Structures of Optical Devices: Materials for Optical Devices. Structures of Optical Devices.

Crystal Growth: Preparation of Materials by LPE. Preparation of Materials by MOVPE. Preparation of Materials by MBE.

Fabrication Processes of Optical Devices: Fabrication Processes.

Device Characteristics and Life Testing: Device Characteristics. Life Testing of Devices.

Evaluation Techniques for III-V Compound Semiconductors and Degraded Optical Devices: Classification of Evaluation Techniques. Visual Inspection. Chemical Etching. Optical Measurement. Electrical Measurement. Structural Evaluation of Semiconductors by Transmission Electron Microscopy.
Analytical Techniques. Flow Chart for Evaluation of Degraded Optical Devices.

Materials Issues in III-V Compound Semiconductors I — Defect Generation: Classification of Defects. Growth-induced Defects. Process-induced defects.

Materials Issues in III-V Compound Semiconductors I — Thermal Stability of III-V Alloy Semiconductors: Composition Modulated Structures. Ordered Structures. Influence of Modulated Structures on the Properties and Reliability of Optical Devices.

Classification of Degradation Modes and Degradation Phenomena in Optical Devices: Classification of Degradation Modes in the Life Testing of Lasers and LEDs. Classification of Degradation Phenomena in Lasers. Degradation in LEDs. Influence of Stress on the Device Degradation.

Degradation I — Rapid Degradation: Rapid Degradation in GaAlAs/GaAs Optical Devices. Rapid Degradation in InGaAsP/InP Optical Devices.Rapid Degradation in InGaAsP/InGaP Optical Devices. Comparison of Recombination-enhanced Defect Reaction in Different III-V Materials. Elimination of the Rapid Degradation.

Degradation II — Gradual Degradation: Gradual Degradation in GaAlAs DH LEDs. Gradual Degradation in InGaAsP/InP DH LEDs. Comparison of Gradual Degradation in GaAlAs/GaAs and In GaAsP/InP Optical Devices. Enhancement of Gradual Degradation by Internal Stress in GaAlAs Visible Lasers.

Degradation III — Catastrophic Failure: Catastrophic Failure in Lasers. Catastrophic Failure in LEDs. Elimination of Catastrophic Failure.

Editorial Reviews

Characterizes the defects and other crystal imperfections induced during the growth and processing of the optical material used in lasers for optical-fiber communications systems, digital audio systems, optical printers, and other devices; examines the degraded optical devices made from them; investigates differences between the various degradation processes, and proposes ideas for eliminating degradation. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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