Progress in Transmission Electron Microscopy 2: Applications in Materials Science / Edition 1

by Xiao-Feng Zhang, Ze Zhang

Overview

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Product Details

ISBN-13:	9783540676812
Publisher:	Springer Berlin Heidelberg
Publication date:	12/12/2001
Series:	Springer Series in Surface Sciences , #39
Edition description:	2001
Pages:	307
Product dimensions:	6.10(w) x 9.25(h) x 0.03(d)

Table of Contents

1. The Guidance Role of HRTEM in Developing Mesoporous Molecular Sieves.- 2. HREM Study of Carbon Nanoclusters Grown from Carbon Arc-Discharge.- 3. Determining the Helicity of Carbon Nanotubes by Electron Diffraction.- 4. Low-Dimensional Materials and their Microstructures Studied by High-Resolution Electron Microscopy.- 5. Microstructure of High-Tc Superconducting Josephson Junctions.- 6. Swift Heavy Ion Irradiation Damage in Superconductors.- 7. TEM Investigations of Misfit Dislocations in Lattice-Mismatched Semiconductor Heterostructures.- 8. Dislocated Contrast Analysis.- 9. Transmission Electron Cryomicroscopy and Three-Dimensional Reconstruction of Macromolecular Complexes.