Pipelined analog to digital converters (ADCs) have become the architecture of choice for high-speed and moderate- to high-resolution devices. Subsequently, different techniques of fault diagnosis by the built-in self-test (BIST) system have been developed.
An ideal reference for graduate students and researchers within electrical, electronics and computer engineering, this book provides a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed.
Pipelined analog to digital converters (ADCs) have become the architecture of choice for high-speed and moderate- to high-resolution devices. Subsequently, different techniques of fault diagnosis by the built-in self-test (BIST) system have been developed.
An ideal reference for graduate students and researchers within electrical, electronics and computer engineering, this book provides a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed.
Pipelined Analog to Digital Converter and Fault Diagnosis
300
Pipelined Analog to Digital Converter and Fault Diagnosis
300eBook
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Product Details
| ISBN-13: | 9780750317320 |
|---|---|
| Publisher: | Institute of Physics Publishing |
| Publication date: | 03/19/2020 |
| Series: | IOP ebooks |
| Sold by: | Barnes & Noble |
| Format: | eBook |
| Pages: | 300 |
| File size: | 15 MB |
| Note: | This product may take a few minutes to download. |