Photoelectron Spectroscopy: Bulk and Surface Electronic Structures

by Shigemasa Suga, Akira Sekiyama, Christian Tusche

Overview

Photoelectron spectroscopy is now becoming more and more required to investigate electronic structures of various solid materials in the bulk, on surfaces as well as at buried interfaces. The energy resolution was much improved in the last decade down to 1 meV in the low photon energy region. Now this technique is available from a few eV up to 10 keV by use of lasers, electron cyclotron resonance lamps in addition to synchrotron radiation and X-ray tubes. High resolution angle resolved photoelectron spectroscopy (ARPES) is now widely applied to band mapping of materials. It attracts a wide attention from both fundamental science and material engineering. Studies of the dynamics of excited states are feasible by time of flight spectroscopy with fully utilizing the pulse structures of synchrotron radiation as well as lasers including the free electron lasers (FEL). Spin resolved studies also made dramatic progress by using higher efficiency spin detectors and two dimensional spin detectors. Polarization dependent measurements in the whole photon energy spectrum of the spectra provide useful information on the symmetry of orbitals. The book deals with the fundamental concepts and approaches for the application of this technique to materials studies. Complementary techniques such as inverse photoemission, photoelectron diffraction, photon spectroscopy including infrared and X-ray and scanning tunneling spectroscopy are presented. This book provides not only a wide scope of photoelectron spectroscopy of solids but also extends our understanding of electronic structures beyond photoelectron spectroscopy.

Product Details

ISBN-13:	9783030640736
Publisher:	Springer-Verlag New York, LLC
Publication date:	06/30/2021
Series:	Springer Series in Surface Sciences , #72
Sold by:	Barnes & Noble
Format:	eBook
File size:	115 MB
Note:	This product may take a few minutes to download.

About the Author

Prof. Shigemasa Suga is currently an invited professor at the Institute of Scientific and Industrial Researches (ISIR), Osaka University and, since 2015, a guest professor at the Jülich Research Center in Germany. He is an internationally recognized expert in the field of photoelectron spectroscopy using soft synchrotron x-rays, having authored over 300 scientific papers on the subject and been fully responsible for the world’s first spectroscopy-dedicated synchrotron radiation facility based on an electron storage ring (SOR-Ring, Tanashi-city, Tokyo). Throughout his career, he has been heavily involved in beamline organization and oversight, both in Japan and abroad, and served as co-editor of the Journal of Synchrotron Radiation from 2000-2004. He is recipient of the Eugen und Ilse Seibold Award of the German Research Foundation, and the Helmholtz-Humboldt Research Award of the Humboldt Research foundation.

Prof. Akira Sekiyama is a full professor in the Department of Materials Engineering Science at Osaka University. He is an expert in x-ray investigations of strongly-correlated electronic structures, and was instrumental in developing high-resolution soft x-ray and three-dimensional angle-resolved photoemission techniques at the SPring-8 synchrotron radiation facility. He has published more than 190 papers on photoemission spectroscopy and is recipient of the 2016 award from the International Conference on Vacuum Ultraviolet and X-ray Physics.

Dr. Christian Tusche is head of the Momentum Microscopy group at the Peter Grünberg Institute of the Jülich Research Center. His research focuses on the electronic properties and their spin-dependent dynamics in ferromagnets, strongly correlated electron systems, and topological quantum materials. Throughout his career, he investigated new and efficient ways for performing spin-resolved measurements of the electronic structure of novel materials. He was awarded the Innovation Award on Synchrotron Radiation in 2015 in Berlin, and the prestigious Kai Siegbahn Prize in 2018 in Uppsala. He has authored and co-authored over 60 peer-reviewed papers, book chapters, and patents.

Table of Contents

Theoretical Background.- Instrumentation and Methodology.- Bulk and Surface Sensitivity of Photoelectron Spectroscopy.- Examples of Angle Integrated Photoelectron Spectroscopy.- Angle-Resolved Photoelectron Spectroscopy in HV-regions.- High Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems.- Very Low Photon Energy Photoelectron Spectroscopy.- Inverse Photoemission.- Photoelectron Diffraction.- Complementary Techniques for Studying Bulk Electronic Structures.- Surface Spectroscopy by Scanning Tunneling Microscope.