Optics at the Nanometer Scale: Imaging and Storing with Photonic Near Fields

by M. Nieto-vesperinas (Editor), N. Garcïa (Editor)

Overview

Optics at the Nanometer Scale: Imaging and Storing with Photonic Near Fields deals with the fundamentals of and the latest developments and applications of near-field optical microscopy, giving basic accounts of how and under what circumstances superresolution beyond the half- wavelength Rayleigh limit is achieved. Interferometric and fluorescence techniques are also described, leading to molecular and even atomic resolution using light. The storage of optical information at this level of resolution is also addressed.

Product Details

ISBN-13:	9789401065948
Publisher:	Springer Netherlands
Publication date:	10/04/2011
Series:	NATO Science Series E: , #319
Edition description:	Softcover reprint of the original 1st ed. 1996
Pages:	312
Product dimensions:	6.10(w) x 9.25(h) x 0.03(d)

Table of Contents

Theory and Basic Principles.- Theory of Imaging in Near-Field Microscopy.- Light Scattering by Tips in Front of Surfaces.- A Numerical Study of a Model Near-Field Optical Microscope.- Short and Long Range Interactions in Near Field Optics.- Modelling Optical Resonators Probed by Subwavelength Sized Optical Detectors.- Experiments: Fundamentals and Applications.- Instrumentation in Near Field Optics.- Effect of the Coherence in Near Field Microscopy.- Scanning Interferometric Apertureless Microscopy at Ten Angstrom Resolution.- Primary Imaging Modes in Near-Field Microscopy.- Local Excitation of Surface Plasmons by TNOM.- Weak Localization of Surface Plasmon Polaritons: Direct Observation with Photon Scanning Tunneling Microscope.- STM-Induced Photon Emission from Au (110).- Writing of Nanolines on a Ferroelectric Surface with a Scanning Near-Field Optical Microscope.- Near Field Optics with High-Q Whispering-Gallery Modes.- Fluorescence Microscopy and Spectroscopy by Scanning Near-Field Optical/Atomic Force Microscope (SNOM-AFM).- Fluorescence Lifetime Contrast Combined with Probe Microscopy.- Towards SNIM: Scanning Near-Field Microscopy in the Infrared.- 6 NM Lateral Resolution in Scanning Near Field Optical Microscopy with the Tetrahedral Tip.- An Aperture-Type Reflection-Mode SNOM.- Surface Modifications Via Photo-Chemistry in a Reflection Scanning Near-Field Optical Microscope.- Near-Field Diffraction Microscopy with a Coherent Low-Energy e-Beam: Fresnel Projection Microscope.- Author Index.

Editorial Reviews

‘This book is essential reading not only for specialists in the field, but for newcomers. It sets out basics on which we can build. I recommend it very highly indeed.'
L. Grosser in Optik, 106:1 (1997)

From the Publisher

Contains papers from the September 1995 workshop, presenting material on the fundamentals of optical microscopy and on emerging areas including new interferometric methods and applications in fluorescence and information encoding. Topics include light scattering by tips in front of surfaces; modeling optical resonators probed by subwavelength sized optical detectors; primary imaging modes in near-field microscopy; local excitation of surface plasmons by TNOM; and fluorescence microscopy and spectroscopy by scanning near-field optical/atomic force microscope. Includes b&w images. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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