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![Introduction to Focused Ion Beam Nanometrology](http://img.images-bn.com/static/redesign/srcs/images/grey-box.png?v11.9.4)
Introduction to Focused Ion Beam Nanometrology
84![Introduction to Focused Ion Beam Nanometrology](http://img.images-bn.com/static/redesign/srcs/images/grey-box.png?v11.9.4)
Introduction to Focused Ion Beam Nanometrology
84
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Product Details
ISBN-13: | 9781681741482 |
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Publisher: | Morgan & Claypool Publishers |
Publication date: | 10/01/2015 |
Series: | Series in Micro- and Nano-metrology |
Sold by: | Barnes & Noble |
Format: | eBook |
Pages: | 84 |
File size: | 7 MB |
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