Handbook of Ion Beam Processing Technology: Principles, Deposition, Film Modification and Synthesis

by Jerome J. Cuomo, Stephen M. Rossnagel, Harold R. Kaufman

Overview

Deals with ion beam processing for basic sputter etching of samples, sputter deposition of thin films, the synthesis of material in thin film form, and the modification of the properties of thin films.

Product Details

ISBN-13:	9780815511991
Publisher:	Elsevier Science
Publication date:	12/31/1989
Series:	Materials Science and Process Technology Series
Pages:	456
Product dimensions:	6.00(w) x 9.00(h) x (d)

Table of Contents

Perspective on Past, Present and Future Uses of Ion Beam TechnologyPart I. Ion Beam TechnologyGridded Broad-beam Ion SourcesECR Ion SourcesHall Effect Ion SourcesIonized Cluster Beam (ICB) Deposition and EpitaxyPart II. Sputtering PhenomenaQuantitative SputteringLaser-induced Fluorescence as a Tool for the Study of Ion Beam SputteringCharacterization of Atoms Desorbed from Surfaces by Ion Bombardment Using Multiphoton Ionization DetectionPart III. Film Modification and SynthesisThe Modification of Films by Ion BombardmentControl of Film Properties by Ion-assisted Deposition Using Broad Beam SourcesEtching with Directed BeamsFilm Growth Modification by Concurrent Ion Bombardment: Theory and SimulationInterface Structure and Thin Film AdhesionModification of Thin Films by Off-normal Incidence Ion BombardmentIon Beam Interactions with Polymer SurfacesTopography: Texturing EffectsMethods and Techniques of Ion Beam ProcessesIon-assisted Dielectric and Optical CoatingsDiamond and Diamond-like Thin Films by Ion Beam TechniquesIndex

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From the Publisher

Deals with ion beam processing for basic sputter etching of samples, sputter deposition of thin films, the synthesis of material in thin film form, and the modification of the properties of thin films.

Editorial Reviews

Deals with ion beam processing for basic sputter etching of samples, sputter deposition of thin films, the synthesis of material in thin film form, and the modification of the properties of thin films. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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