Electron Microscopy and Analysis / Edition 3

by Peter J. Goodhew, John Humphreys, Richard Beanland

Overview

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Product Details

ISBN-13:	9781138441538
Publisher:	Taylor & Francis
Publication date:	07/07/2017
Edition description:	3rd ed.
Pages:	264
Product dimensions:	6.12(w) x 9.19(h) x (d)

About the Author

Peter J. Goodhew, John Humphreys The University of Manchester, Richard Beanland GEC Marconi Materials Technology, England.

Table of Contents

Preface; Abbreviations; 1. Microscopy with Light and Electrons 2. Electrons and Their Interaction with the Specimen 3. Electron Diffraction 4. The Transmission Electron Microscope 5. The Scanning Electron Microscope 6. Chemical Analysis in the Electron Microscope 7. Electron Microscopy and Other Techniques; Further Reading; Index

Editorial Reviews

Three British professors introduce the principles behind both scanning and transmission electron microscopes, describing the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. The third edition adds outlines of confocal light microscopy and scanned probe microscopies. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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