Digital Circuit Testing: A Guide to DFT and Other Techniques / Edition 1

Digital Circuit Testing: A Guide to DFT and Other Techniques / Edition 1

by Francis C. Wong
ISBN-10:
0127345809
ISBN-13:
9780127345802
Pub. Date:
07/28/1991
Publisher:
Elsevier Science
ISBN-10:
0127345809
ISBN-13:
9780127345802
Pub. Date:
07/28/1991
Publisher:
Elsevier Science
Digital Circuit Testing: A Guide to DFT and Other Techniques / Edition 1

Digital Circuit Testing: A Guide to DFT and Other Techniques / Edition 1

by Francis C. Wong

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Overview

Recent technological advances have created a testing crisis in the electronics industry—smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Product Details

ISBN-13: 9780127345802
Publisher: Elsevier Science
Publication date: 07/28/1991
Edition description: New Edition
Pages: 228
Product dimensions: 6.25(w) x 9.25(h) x (d)

Table of Contents

A Test Generation Method Using Testability Results. Circuit ATVG and DFT. PLD Design for Test. Built-In Self Test and Boundary Scan Techniques. ATE and the Testing Process. Special Testing Topics and Conclusions. Index.
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