1 | Introduction | 1 |
2 | Crystal Lattices | 3 |
2.1 | The Lattice | 3 |
2.1.1 | The Unit Cell | 4 |
2.1.2 | Atom Parameters | 5 |
2.1.3 | The Seven Crystal Systems | 6 |
2.2 | The Fourteen Bravais Lattices | 7 |
2.2.1 | The Hexagonal, Trigonal and Rhombohedral Systems | 8 |
2.2.2 | The Reduced Cell | 9 |
3 | The Geometry of X-Ray Diffraction | 13 |
3.1 | X-Rays | 13 |
3.2 | Interference by a One-Dimensional Lattice | 16 |
3.3 | The Laue Equations | 18 |
3.4 | Lattice Planes and hkl-Indices | 20 |
3.5 | The Bragg Equation | 22 |
3.6 | Higher Orders of Diffraction | 23 |
3.7 | The Quadratic Form of the Bragg Equation | 23 |
4 | The Reciprocal Lattice | 27 |
4.1 | From the Direct to the Reciprocal Lattice | 27 |
4.2 | The Ewald Construction | 30 |
5 | Structure Factors | 33 |
5.1 | Atom Formfactors | 33 |
5.2 | Atom Displacement Factors | 35 |
5.3 | Structure Factors | 37 |
6 | Crystal Symmetry | 41 |
6.1 | Simple Symmetry Elements | 41 |
6.1.1 | Coupling of Symmetry Elements | 42 |
6.1.2 | Combination of Symmetry Elements | 44 |
6.2 | Symmetry Directions | 44 |
6.3 | Symmetry Elements Involving Translation | 46 |
6.3.1 | Combination of Translation with Other Symmetry Elements | 46 |
6.3.2 | Coupling of Translation with Other Symmetry Elements | 46 |
6.4 | The 230 Space Groups | 52 |
6.4.1 | Space-group Notation in International Tables for Crystallography | 52 |
6.4.2 | Centrosymmetric Crystal Structures | 55 |
6.4.3 | The Asymmetric Unit | 56 |
6.4.4 | Space Group Types | 57 |
6.4.5 | Group-Subgroup Relationships | 57 |
6.5 | Visible Effects of Symmetry | 58 |
6.5.1 | Microscopic Structure | 58 |
6.5.2 | Macroscopic Properties and Crystal Classes | 59 |
6.5.3 | Symmetry of the Lattice | 59 |
6.5.4 | Symmetry of the Diffraction Pattern--The Laue Groups | 59 |
6.6 | Determination of the Space Group | 61 |
6.6.1 | Determination of the Laue Group | 61 |
6.6.2 | Systematic Absences | 62 |
6.7 | Transformations | 65 |
7 | Experimental Methods | 67 |
7.1 | Growth, Choice and Mounting of a Single Crystal | 67 |
7.2 | Measuring the Diffraction Pattern of Single Crystals | 71 |
7.2.1 | Film Methods | 71 |
7.2.2 | The Four-circle (serial) Diffractometer | 74 |
7.2.3 | Reflection profile and scan type | 78 |
7.3 | Area Detector Systems | 81 |
7.4 | Data Reduction | 86 |
7.4.1 | Lp correction | 86 |
7.4.2 | Standard Uncertainty | 87 |
7.4.3 | Absorption Correction | 89 |
7.5 | Other Diffraction Methods | 91 |
7.5.1 | Neutron Scattering | 91 |
7.5.2 | Electron Scattering | 92 |
8 | Structure Solution | 93 |
8.1 | Fourier Transforms | 93 |
8.2 | Patterson Methods | 95 |
8.2.1 | Symmetry in Patterson Space | 97 |
8.2.2 | Structure Solution Using Harker Peaks | 97 |
8.2.3 | Patterson shift methods | 99 |
8.3 | Direct Methods | 100 |
8.3.1 | Harker-Kasper Inequalities | 100 |
8.3.2 | Normalized Structure Factors | 101 |
8.3.3 | The Sayre Equation | 102 |
8.3.4 | The Triplet Relationship | 103 |
8.3.5 | Origin Fixation | 105 |
8.3.6 | Strategies of Phase Determination | 106 |
9 | Structure Refinement | 111 |
9.1 | The Method of Least Squares | 111 |
9.1.1 | Refinement Based on F[subscript o] or F[superscript 2 subscript o] Data | 115 |
9.2 | Weights | 116 |
9.3 | Crystallographic R-Values | 118 |
9.4 | Refinement Techniques | 119 |
9.4.1 | Location and Treatment of Hydrogen Atoms | 120 |
9.4.2 | Restricted Refinement | 121 |
9.4.3 | Damping | 122 |
9.4.4 | Symmetry Restrictions | 122 |
9.4.5 | Residual Electron Density | 123 |
9.5 | Rietveld Refinement | 124 |
10 | Additional Topics | 127 |
10.1 | Disorder | 127 |
10.1.1 | Site Occupancy Disorder | 127 |
10.1.2 | Positional and Orientational Disorder | 128 |
10.1.3 | One- and Two-Dimensional Disorder | 130 |
10.1.4 | Modulated Structures | 131 |
10.1.5 | Quasicrystals | 131 |
10.2 | Anomalous Dispersion and "Absolute Structure" | 132 |
10.2.1 | Chiral and Polar Space Groups | 137 |
10.3 | Extinction | 139 |
10.4 | The Renninger Effect | 141 |
10.5 | The [lambda]/2-Effect | 142 |
10.6 | Thermal Diffuse Scattering (TDS) | 143 |
11 | Errors and Pitfalls | 145 |
11.1 | Wrong Atom-Types | 145 |
11.2 | Twinning | 146 |
11.2.1 | Classification by the Twin-Element | 147 |
11.2.2 | Classification According to Macroscopic Appearance | 147 |
11.2.3 | Classification According to Origin | 148 |
11.2.4 | Diffraction Patterns of Twinned Crystals and their Interpretation | 149 |
11.2.5 | Twinning or Disorder? | 155 |
11.3 | False Unit Cells | 155 |
11.4 | Space Group Errors | 156 |
11.5 | Misplaced Origins | 158 |
11.6 | Poor Atom Displacement Parameters | 159 |
12 | Interpretation and Presentation of Results | 161 |
12.1 | Bond Lengths and Bond Angles | 161 |
12.2 | Best Planes and Torsion Angles | 162 |
12.3 | Structural Geometry and Symmetry | 163 |
12.4 | Structural Diagrams | 165 |
12.5 | Electron Density | 169 |
13 | Crystallographic Databases | 171 |
13.1 | The Inorganic Crystal Structure Database (ICSD) | 171 |
13.2 | The Cambridge Structural Database (CSD) | 171 |
13.3 | The Metals Crystallographic Data File (CRYST-MET) | 175 |
13.4 | Other Collections of Crystal Structure Data | 175 |
13.5 | Deposition of Structural Data in Data Bases | 175 |
13.6 | Crystallography on the Internet | 176 |
14 | Outline of a Crystal Structure Determination | 177 |
15 | Worked Example of a Structure Determination | 181 |
| Bibliography | 199 |
| Index | 205 |