CMOS Test and Evaluation: A Physical Perspective

by Manjul Bhushan, Mark B. Ketchen

Overview

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Product Details

ISBN-13:	9781493947027
Publisher:	Springer New York
Publication date:	09/10/2016
Edition description:	Softcover reprint of the original 1st ed. 2015
Pages:	424
Product dimensions:	6.10(w) x 9.25(h) x 0.04(d)

About the Author

Manjul Bhushan is a technical consultant in New York.

Mark Ketchen is a technical consultant in Massachusetts.

Table of Contents

Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.