Advances in Imaging and Electron Physics

by Peter W. Hawkes (Editor)

Overview

The series bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes it essential reading.

This volume looks at theory and it’s application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and electron physics and apply them to realistic practical situations.

* Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
* Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
* Provides the steps in finding answers for the highly debated questions

Product Details

ISBN-13:	9780080462769
Publisher:	Elsevier Science
Publication date:	07/29/2011
Series:	ISSN , #139
Sold by:	Barnes & Noble
Format:	eBook
Pages:	328
File size:	13 MB
Note:	This product may take a few minutes to download.

About the Author

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Table of Contents

Evanescent Waves in the Near and the Far Field (ARNOLDUS); Symmetry and the Karhunen-Loeve Decomposition (LAHME); Analysis of Irregularly Sampled Data: A Review (PIRODDI and PETROU); Recent Developments in the Microscopy of Ceramics (RAINFORTH); Five Dimensional Hamilton-Jacobi Approach to Relativistic Quantum Mechanics (ROSE); Redundant Multiscale Transforms and Their Application for Morphological Component Separation (STARK, ELAD and DONOHO)

What People are Saying About This

From the Publisher

Advances in Imaging and Electron Physics features cutting-edge articles on areas such as image science and digital image processing, the physics of electron devices, and electron microscopy.

Editorial Reviews

The four surveys contained in this volume illustrate widely diverse aspects of imaging and electron physics. The first two chapters address applications of electron microscopy, including the role of this technique in mineralogy and a study of the high- resolution electron microscopy of quasicrystals. The latter is actually a short monograph presenting the underlying crystallography and explaining in detail how the corresponding images and diffraction patterns should be interpreted. The third contribution is an account of a new approach to deconvolution in image processing in which the author, by associating a polynomial with the gray-level values of (discrete) images, shows that it is possible to invert the convolutional relation that describes many kinds of image formation. The volume ends with a detailed discussion of the dual de Broglie wave, including a critical account of new developments in the debate over the existence and role of such a wave. Annotation c. by Book News, Inc., Portland, Or.

Booknews

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." —J.A. Chapman in LABORATORY PRACTICE

From the Publisher