Advances in Imaging and Electron Physics merges two long-running serialsAdvances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers
Advances in Imaging and Electron Physics merges two long-running serialsAdvances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers
392![Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers](http://vs-images.bn-web.com/static/redesign/srcs/images/grey-box.png?v11.11.1)
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers
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238.0
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Product Details
ISBN-13: | 9780123859846 |
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Publisher: | Elsevier Science |
Publication date: | 07/20/2011 |
Series: | ISSN , #168 |
Sold by: | Barnes & Noble |
Format: | eBook |
Pages: | 392 |
File size: | 15 MB |
Note: | This product may take a few minutes to download. |
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