ADV MATH & COMP TOOL METROL XII

by F Pavese (Editor), A B Forbes (Editor), N F Zhang (Editor), A G Chunovkina (Editor)

Overview

This volume contains original, refereed contributions by researchers from national metrology institutes, universities and laboratories across the world involved in metrology and testing. The volume has been produced by the International Measurement Confederation Technical Committee 21, Mathematical Tools for Measurements and is the twelfth in the series. The papers cover topics in numerical analysis and computational tools, statistical inference, regression, calibration and metrological traceability, computer science and data provenance, and describe applications in a wide range of application domains. This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. It will also be of interest to scientists and engineers concerned with the reliability, trustworthiness and reproducibility of data and data analytics in data-driven systems in engineering, environmental and life sciences.Contents:

• Dedication
• Foreword
• Invited Paper:
  • Explicit Unconditionally Numerically Stable Solution of a Class of Cubic Equations (M G Cox)
• Review Papers:
  • Effective Number of Degrees of Freedom Associated with Regression Models (A B Forbes)
  • Bayesian Signal Analysis and Parameter Estimation — A Tutorial Review (G A Kyriazis)
  • Review on Questionable Consistency Issues between the CGPM Resolution 1 on Revised SI (2018) and the 9th BIPM SI Brochure (2019) (F Pavese)
  • Statistical and Computational Tools for Metrologists (S Stoudt and A Possolo)
  • Measurement Results and Fuzzy Models (R Viertl)
• Papers:
  • Uncertainty Calculation in Nanoflow Measurements Using Interferometry (E Batista, A Furtado, J Pereira, I Godinho, and R F Martins)
  • What If We Use Almost-Linear Functions Instead of Linear Ones as a First Approximation in Interval Computations (M Ceberio, O Kosheleva, and V Kreinovich)
  • Data Provenance, Curation and Quality in Metrology (J Cheney, A Chapman, J Davidson, and A B Forbes)
  • On Estimation of Linear Regression Confidence Bands: Analytical Solution and Monte Carlo Simulation (A G Chunovkina, A V Stepanov, and G Wimmer)
  • Repeatability, Reproducibility and Resampled Effects Models (A B Forbes and K Jagan)
  • Uncertainty Evaluation in Rheology Measurements (A Furtado, J Pereira, J A Sousa, M G Cox, and A S Ribeiro)
  • Measuring Instruments Comparison for Calibration and Check: Four Typical Tasks of Data Processing (V A Granovskii)
  • Discrete Wavelet Transform on Uncertain Data: Efficient Online Implementation for Practical Applications (M Gruber, T Dorst, A Schütze, S Eichstädt, and C Elster)
  • Digital Representation of Measurement Uncertainty for Metrological Traceability (B D Hall and D R White)
  • Software Representation of Measured Physical Quantities (B D Hall)
  • Combining Data Streams of Doubtful Provenance (K Jagan and A B Forbes)
  • Using Measurement Uncertainty in a Risk-Based Decision-Making Framework for Clinical Diagnosis (K Jagan, P M Harris, N A S Smith, J Teuho, R Siekkinen, J Schultz, and A Saraste)
  • Evaluation of Measurement Uncertainty in SBI — Single Burning Item Reaction to Fire Test (L L Martins, A S Ribeiro, M G Cox, and J A Sousa)
  • Type Systems for Programs Respecting Dimensions (C McBride and F Nordvall-Forsberg)
  • Measurement in Science: Between Evaluation and Prediction (F Pavese)
  • A Method Based on Combinations of Forecaster and Weighing Matrix to Detect Fault of Components in Diecasting Process (L Provezza, G Sansoni, M Lancini, and A Marini)
  • Practical Experiment Design of Task-Specific Uncertainty Evaluation for Coordinate Metrology (O Sato, T Takatsuji, and A Balsamo)
  • How to Separate Absolute and Relative Error Components: Interval Case (C Servin, O Kosheleva, and V Keinovich)
  • Proficiency Testing with Ordinal Categorical Data (T Suzuki, M Isono, and J Takashita)
  • How to Describe Measurement Errors: A Natural Generalization of the Central Limit Theorem Beyond Normal (and Other Infinitely Divisible) Distributions (J C Urenda, O Kosheleva, and V Keinovich)
  • Modelling of the Dynamic Gravimetric Preparation of Calibration Gas Mixtures Using Permeation of Trace Gas Analysis (A M H van der Veen, H Meuzelaar, M Čaušević, and M G Cox)
  • Adaptive Measuring System with Dynamic Error Estimation of the First-Order Sensor (A S Volosnikov)

Readership: Researchers, graduate students, academics and quality engineers working in metrology and its applications to manufacturing, environment, health and life sciences.Algorithms;Data Analysis;Metrology;Traceability;Uncertainty Evaluation0Key Features:

• Description of state-of-the-art techniques for modeling measurement systems and analyzing measurement data
• Written by researchers active in institutions developing world-leading measurement capabilities
• Provides a multi-disciplinary approach to addressing measurement challenges in a wide range of application domains

Product Details

ISBN-13:	9789811242397
Publisher:	WSPC
Publication date:	01/13/2022
Series:	SERIES ON ADVANCES IN MATH FOR APPLIED SCIENCES , #90
Sold by:	Barnes & Noble
Format:	eBook
Pages:	548
File size:	25 MB
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