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Title: Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997, Author: J. Doneker
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Defect Recognition and Image…
by J. Doneker
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eBook $300.49 $400.00 Current price is $300.49, Original price is $400.00.
Title: Maximum Entropy and Bayesian Methods, Author: Ali Mohammad-Djafari
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Maximum Entropy and Bayesian…
by Ali Mohammad-Djafari (Editor), G. Demoment (Editor)
#53 in Series
Paperback $329.99
Title: Maximum Entropy and Bayesian Methods, Author: Ali Mohammad-Djafari
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Maximum Entropy and Bayesian…
by Ali Mohammad-Djafari (Editor), G. Demoment (Editor)
#53 in Series
Hardcover $329.99
Title: Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997 / Edition 1, Author: J. Doneker
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Defect Recognition and Image…
by J. Doneker, I. Rechenberg
#160 in Series
Hardcover $400.00

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