Title: Electron Energy-Loss Spectroscopy in the Electron Microscope, Author: R.F. Egerton
Title: Tempature-Programmed Reduction for Solid Materials Characterization / Edition 1, Author: Alan Jones
Title: Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces, Author: P.K. Larsen
Title: Elastic and Inelastic Scattering in Electron Diffraction and Imaging / Edition 1, Author: Zhong-lin Wang
Title: Characterization of High Tc Materials and Devices by Electron Microscopy, Author: Nigel D. Browning
Title: The Assay of Spatially Random Material, Author: Yakov Ben-Haim
Title: Scanning Electron Microscopy for the Life Sciences, Author: Heide Schatten PhD
Title: The Materiality of Individuality: Archaeological Studies of Individual Lives / Edition 1, Author: Carolyn L. White
Title: Secondary Electron Energy Spectroscopy In The Scanning Electron Microscope, Author: Anjam Khursheed
Title: Models of Lung Disease: Microscopy and Structural Methods / Edition 1, Author: Joan Gil
Title: Freeze-Fracture Studies of Membranes, Author: Sek Wen Hui
Title: Scanning Microscopy for Nanotechnology: Techniques and Applications / Edition 1, Author: Weilie Zhou
Title: Ultrastructural Pathology of the Cell and Matrix: A Text and Atlas of Physiological and Pathological Alterations in the Fine Structure of Cellular and Extracellular Components, Author: Feroze N. Ghadially
eBook $79.99 $93.95 Current price is $79.99, Original price is $93.95.
Title: Electron Tomography: Methods for Three-Dimensional Visualization of Structures in the Cell / Edition 2, Author: Joachim Frank
Title: Evaluation of Advanced Semiconductor Materials by Electron Microscopy, Author: David Cherns
Title: Retinal and Choroidal Vascular Changes and Systemic Diseases in Rats: Corrosion Cast and Scanning Electron Microscopy, Author: T. Amemiya
Title: Biological Electron Microscopy: Theory, Techniques, and Troubleshooting / Edition 2, Author: Michael J. Dykstra
Title: Diagnostic Electron Microscopy: A Text/Atlas / Edition 2, Author: Richard G. Dickersin
Title: Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997 / Edition 1, Author: John M. Rodenburg
Title: Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction, Author: Rolf Erni

Pagination Links